Reliability Test

We provide complete environmental and electrical reliability test service for both power devices and IC. We hire the well recognized semiconductor reliability laboratories in the regions. Reliability tests cover Temperature cycling (TMCL), Pressure cycle test (PCT), Salt Atmosphere test, High temperature storage (HTSL), Low temperature storage (LTSL), Highly accelerated Stress test (HAST), High temperature reverse bias (HTRB) and Temperature Humidity Bias Test (THBT), etc.

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